DocumentCode
2349346
Title
Software as a method of technology transfer
Author
Osterman, M. ; Rust, C. ; Stadterman, T. ; Jackson, P. ; Rosman, M. ; Hoffman, D.
Author_Institution
CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA
fYear
1995
fDate
16-17 May 1995
Firstpage
6
Lastpage
11
Abstract
The CALCE Electronics Packaging Research Center (EPRC) located at the University of Maryland in College Park, Maryland uses software tools developed in-house to transfer technology to industry. Over the past seven years, the CALCE EPRC has developed and fielded various software tools which have aided industry in evaluating electronic packaging designs from a physics of failure standpoint. The software is used to model and assess Printed Wiring Assembly and microelectronic designs. Tools include thermal analysis, vibrational analysis, solder joint fatigue assessment and plated-through hole assessment. In the field, the CALCE software has enjoyed dual use by both government and industry consortium members. In this paper, we present lessons learned in the successful implementation of software as a technology transfer vehicle. To this end, several case studies of industrial usage are presented. The following examples are included. Honeywell has used CALCE software to perform thermal assessments of a new cooling technology which could not be performed with existing software tools. AlliedSignal has integrated CALCE software into their Integrated Product Design System. Texas Instruments has incorporated software tools developed by the CALCE EPRC into their internally used Computer Aided Reliability and Maintainability Applications (CARMA) tool suite. The U.S. Army has used the CALCE PWA software to compare commercial and ruggedized microelectronic assemblies
Keywords
CAD; cooling; failure analysis; packaging; printed circuit design; software packages; software tools; soldering; technology transfer; thermal analysis; thermal stresses; CALCE Electronics Packaging Research Center; cooling technology; electronic packaging designs; failure physics; plated-through hole assessment; printed wiring assembly; software tools; solder joint fatigue assessment; technology transfer; thermal analysis; vibrational analysis; Assembly; Computer industry; Educational institutions; Electronics industry; Electronics packaging; Microelectronics; Physics; Software tools; Technology transfer; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Microelectronics Symposium, 1995., Proceedings of the Eleventh Biennial
Conference_Location
Austin, TX
ISSN
0749-6877
Print_ISBN
0-7803-2596-6
Type
conf
DOI
10.1109/UGIM.1995.514106
Filename
514106
Link To Document