Title :
A simple adapted gummel method for amorphous silicon device simulation
Author :
Tsai, Yao-Tsung ; Hong, Kuo-Don ; Yuan, Yin-Lun
Author_Institution :
National Central University
Keywords :
Amorphous silicon; Analytical models; Convergence; Electron traps; Electronic design automation and methodology; Electrostatics; Metal-insulator structures; Poisson equations; Taylor series; Time of arrival estimation;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.863884
