Title :
SOI MESFETs for extreme environment buck regulators
Author :
Lepkowski, W. ; Goryll, M. ; Wilk, S.J. ; Zhang, Y. ; Sochacki, J. ; Thornton, T.J.
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Abstract :
The next step to confirm the MESFET´s ability to handle extreme environments will be testing the buck regulator in the presence of radiation. These measurements will be completed in the coming month and the results presented at the conference. Eventually the goal will be to integrate the MESFET with the feedback circuitry and to more carefully design the buck regulator board, choosing components that maximize the efficiency and reduce the parasitics. Already extensive work has been done to reduce the layout size of the MESFET in Fig. 2 by over 50%.
Keywords :
CMOS integrated circuits; Schottky gate field effect transistors; silicon-on-insulator; CMOS; SOI MESFET; extreme environment buck regulator board; feedback circuitry; radiation presence; CMOS integrated circuits; Logic gates; MESFETs; Regulators; Schottky diodes; Voltage control; Voltage measurement;
Conference_Titel :
SOI Conference (SOI), 2011 IEEE International
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-61284-761-0
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2011.6081696