DocumentCode :
2349522
Title :
Exploring defect data from development and customer usage on software modules over multiple releases
Author :
Biyani, Shriram ; Santhanam, P.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1998
fDate :
4-7 Nov 1998
Firstpage :
316
Lastpage :
320
Abstract :
Traditional defect analyses of software modules have focused on either identifying error prone modules or predicting the number of faults in a module, based on a set of module attributes such as complexity, lines of code, etc. In contrast to these metrics based modeling studies, the paper explores the relationship of the number of faults per module to the prior history of the module. Specifically, we examine the relationship between: (a) the faults discovered during development of a product release and those escaped to the field; and (b) faults in the current release and faults in previous releases. Based on the actual data from four releases of a commercial application product consisting of several thousand modules, we show that: modules with more defects in development have a higher probability of failure in the field; there is a way to assess the relative quality of software releases without detailed information on the exact release content or code size; and it is sufficient to consider just the previous release for predicting the number of defects during development or field. These results can be used to improve the prediction of quality at the module level of future releases based on the past history
Keywords :
software development management; software packages; software performance evaluation; software quality; commercial application product; current release; customer usage; defect data; error prone modules; metrics based modeling studies; module attributes; multiple releases; past history; previous releases; prior history; product release; relative quality; software defect analyses; software modules; software releases; Data analysis; Data mining; History; Linear regression; Mathematical model; Neural networks; Software engineering; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering, 1998. Proceedings. The Ninth International Symposium on
Conference_Location :
Paderborn
ISSN :
1071-9458
Print_ISBN :
0-8186-8991-9
Type :
conf
DOI :
10.1109/ISSRE.1998.730896
Filename :
730896
Link To Document :
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