DocumentCode
2349620
Title
Novel architecture to boost the vertical tunneling in Tunnel Field Effect Transistors
Author
Leonelli, D. ; Vandooren, A. ; Rooyackers, R. ; Verhulst, A.S. ; Huyghebaert, C. ; De Gendt, S. ; Heyns, M.M. ; Groeseneken, G.
Author_Institution
Imec, Leuven, Belgium
fYear
2011
fDate
3-6 Oct. 2011
Firstpage
1
Lastpage
2
Abstract
A novel architecture to boost the performance of the Tunnel Field Effect Transistor is proposed. The improvement of drive current and subthreshold swing is achieved by inserting the channel between the source region and the gate dielectric, confining the electric field in the undoped channel region. The main feature of this architecture is to boost the vertical tunneling while suppressing the lateral tunneling path responsible for the degradation of the subthreshold swing.
Keywords
electric fields; field effect transistors; tunnel transistors; drive current; electric field; gate dielectric; lateral tunneling path suppression; source region; subthreshold swing; tunnel field effect transistors; undoped channel region; vertical tunneling; Degradation; FETs; Junctions; Logic gates; Silicon; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference (SOI), 2011 IEEE International
Conference_Location
Tempe, AZ
ISSN
1078-621X
Print_ISBN
978-1-61284-761-0
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2011.6081704
Filename
6081704
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