• DocumentCode
    2349620
  • Title

    Novel architecture to boost the vertical tunneling in Tunnel Field Effect Transistors

  • Author

    Leonelli, D. ; Vandooren, A. ; Rooyackers, R. ; Verhulst, A.S. ; Huyghebaert, C. ; De Gendt, S. ; Heyns, M.M. ; Groeseneken, G.

  • Author_Institution
    Imec, Leuven, Belgium
  • fYear
    2011
  • fDate
    3-6 Oct. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A novel architecture to boost the performance of the Tunnel Field Effect Transistor is proposed. The improvement of drive current and subthreshold swing is achieved by inserting the channel between the source region and the gate dielectric, confining the electric field in the undoped channel region. The main feature of this architecture is to boost the vertical tunneling while suppressing the lateral tunneling path responsible for the degradation of the subthreshold swing.
  • Keywords
    electric fields; field effect transistors; tunnel transistors; drive current; electric field; gate dielectric; lateral tunneling path suppression; source region; subthreshold swing; tunnel field effect transistors; undoped channel region; vertical tunneling; Degradation; FETs; Junctions; Logic gates; Silicon; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2011 IEEE International
  • Conference_Location
    Tempe, AZ
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-61284-761-0
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2011.6081704
  • Filename
    6081704