Title :
Analysis of interface state induced performance variation in LDD MOSFET´s
Author :
Wang, T. ; Huang, C. ; Chou, P.C. ; Chung, S.S. ; Chang, T.E.
Author_Institution :
National Chiao-Tung University
Keywords :
Character generation; Degradation; Electron traps; Hot carriers; Interface states; MOSFET circuits; Numerical simulation; Performance analysis; Secondary generated hot electron injection; Stress;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.863897
