DocumentCode
2349622
Title
Analysis of interface state induced performance variation in LDD MOSFET´s
Author
Wang, T. ; Huang, C. ; Chou, P.C. ; Chung, S.S. ; Chang, T.E.
Author_Institution
National Chiao-Tung University
fYear
1994
fDate
1994
Keywords
Character generation; Degradation; Electron traps; Hot carriers; Interface states; MOSFET circuits; Numerical simulation; Performance analysis; Secondary generated hot electron injection; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
Type
conf
DOI
10.1109/EDMS.1994.863897
Filename
863897
Link To Document