DocumentCode :
2349665
Title :
Viterbi-Based Efficient Test Data Compression
Author :
Lee, Dongsoo ; Roy, Kaushik
Author_Institution :
Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2011
fDate :
23-27 May 2011
Firstpage :
204
Lastpage :
204
Abstract :
Researchers have proposed numerous test compression techniques that provide comparable fault coverage to that of conventional ATPG and reduce the amount of test data and test time. Among them, the linear-decompression-based schemes have gained popularity for simplicity and high encoding efficiency. However, they lack the knowledge about the effects of compressed test vectors toward other test requirements. We propose a Viterbi based test data compression technique. The on-chip Viterbi decompressors accept n bits from the external tester and apply m bits into internal scan chains (m>;>;n ). Each decompressor needs only one test channel and the encoding efficiency is independent of the number of test channels. During the generation of a compressed test vector, the Viterbi algorithm traces the cost function of each possible compressed vector and decides the most desirable compressed vector. The proposed architecture, thus, presents a platform to combine test compression with other test considerations such as low power consumption, vector repetition.
Keywords :
Viterbi decoding; data compression; logic testing; vectors; ATPG; Viterbi algorithm; Viterbi-based efficient test data compression techniques; compressed test vector repetition; cost function; encoding efficiency; fault coverage; internal scan chains; linear decompression-based scheme; on-chip Viterbi decompressor; power consumption; test channel; Design automation; Hamming distance; Indexes; Logic gates; Measurement; Test data compression; Viterbi algorithm; Logic Test; Low-Power Test; On-Chip Decompressor; Scalability; Test Data Compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
ISSN :
1530-1877
Print_ISBN :
978-1-4577-0483-3
Electronic_ISBN :
1530-1877
Type :
conf
DOI :
10.1109/ETS.2011.12
Filename :
5957950
Link To Document :
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