• DocumentCode
    2349774
  • Title

    High-Performance Diagnostic Fault Simulation on GPUs

  • Author

    Li, Min ; Hsiao, Michael S.

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
  • fYear
    2011
  • fDate
    23-27 May 2011
  • Firstpage
    210
  • Lastpage
    210
  • Abstract
    In this paper, we present an efficient diagnostic fault simulator based on a state-of-the-art graphics processing unit (GPU). Diagnostic fault simulation plays an important role to identify and locate the causes of circuit failures. However, today´s complex VLSI circuits pose ever higher computational demand for such simulators. Our GPU based diagnostic fault simulator (GDSim) is based on a novel two-stage simulation framework which exploits high computation efficiency on the GPU. The fault pair based simulation is proposed to overcome the limited capacity of GPU memory as well as achieve a substantial fine-grained parallelism. Multi-fault-signature and dynamic load balancing techniques are introduced for the best usage of computing resources on-board. Experimental results demonstrate a speedup of up to 121× (with average speedup of 38.43×) compared to a state-of-the-art CPU-based diagnostic fault simulator.
  • Keywords
    circuit simulation; coprocessors; electronic engineering computing; fault simulation; integrated circuit modelling; integrated circuit testing; GPU; VLSI circuits; circuit failure; dynamic load balancing techniques; fine grained parallelism; graphics processing unit; high performance diagnostic fault simulation; multifault signature; two stage simulation framework; Acceleration; Benchmark testing; Circuit faults; Graphics processing unit; Integrated circuit modeling; Logic gates; Parallel processing; compute unified device architecture (CUDA); diagnostic faut simulation; general-purpose computing on graphics processing unit (GPGPU); parallel algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2011 16th IEEE European
  • Conference_Location
    Trondheim
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4577-0483-3
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETS.2011.41
  • Filename
    5957956