Title :
Package embedded decoupling capacitor impact on core power delivery network for ARM SoC application
Author :
GaWon Kim ; Min, Moonsik ; Yang, May ; Gundurao, Anil ; You, Eileen ; Gill, Harjot ; Seungyong Cha ; Younghoon Kim ; Se-ho You ; Seungbae Lee ; Woonghwan Ryu
Author_Institution :
Syst. LSI SoC Bay Area R&D (SBR), Samsung Semicond. Inc., San Jose, CA, USA
Abstract :
In this paper, a BGA package having a ARM SoC chip is introduced, which has component-type embedded decoupling capacitors (decaps) for good power integrity performance of core power. To evaluate and confirm the impact of embedded decap on core PDN (power distribution network), two different packages were manufactured with and without the embedded decaps. The self impedances of system-level core PDN were simulated in frequency-domain and On-chip DvD (Dynamic Voltage Drop) simulations were performed in time-domain in order to verify the system-level impact of package embedded decap. There was clear improvement of system-level core PDN performance in middle frequency range when package embedded decaps were employed. In conclusion, the overall system-level core PDN for ARM SoC could meet the target impedance in frequency-domain as well as the target On-chip DvD level by having package embedded decaps.
Keywords :
ball grid arrays; system-on-chip; ARM SoC application; BGA package; core power delivery network; dynamic voltage drop; package embedded decaps; package embedded decoupling capacitor; power distribution network; system level impact; DVD; Frequency-domain analysis; Impedance; Noise; Simulation; Substrates; System-on-chip;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
DOI :
10.1109/ECTC.2014.6897311