• DocumentCode
    2349803
  • Title

    A first generation generic system simulator (GENESYS) and its relation to the NTRS

  • Author

    Eble, John C. ; De, Vivek K. ; Meindl, James D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1995
  • fDate
    16-17 May 1995
  • Firstpage
    147
  • Lastpage
    154
  • Abstract
    The National Technology Roadmap for Semiconductors (NTRS) presents projections and goals for microelectronics over the next fifteen years. A set of physical and empirical models encompassing material, device, circuit, architecture, interconnection, and packaging characteristics that describe microelectronic systems have been captured in the first generation of GENESYS, a GENEric SYstem Simulator. From technology parameters projected in the NTRS, GENESYS predicts maximum clock frequency, physical size, power dissipation, and packaging requirements of an ASIC. The outputs of GENESYS are compared to the on-chip clock frequency, chip size, and maximum power projections of the NTRS for ASICs, and then used both to calibrate GENESYS and to subject the NTRS projections to self-consistency checks
  • Keywords
    application specific integrated circuits; circuit analysis computing; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; ASIC; GENESYS; NTRS; National Technology Roadmap for Semiconductors; first generation generic system simulator; maximum clock frequency; microelectronics; models; packaging requirements; physical size; power dissipation; technology parameters; Character generation; Circuit simulation; Clocks; Frequency; Integrated circuit interconnections; Microelectronics; Power system interconnection; Power system modeling; Semiconductor device packaging; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 1995., Proceedings of the Eleventh Biennial
  • Conference_Location
    Austin, TX
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-2596-6
  • Type

    conf

  • DOI
    10.1109/UGIM.1995.514135
  • Filename
    514135