Revisiting Application-Dependent Test for FPGA Devices

FPGA testing poses a number of challenges related to both the complexity of the device under test and the opportunities introduced by its support to hardware reconfiguration. Application-dependent testing (ADT) provides an effective answer to these challenges. The study presented in this paper identifies some limitations of state-of-the-art ADT approaches, which prevent a complete coverage for bridging faults and the practical applicability of the algorithms for test configuration generation. The work also introduces a set of new techniques that enabled us to overcome these limitations and effectively extend previous methodologies for ADT.