• DocumentCode
    2349835
  • Title

    Comparison of small-signal output conductance frequency dependence in UTBB SOI MOSFETs with and without ground plane

  • Author

    Makovejev, S. ; Raskin, J. -P ; Flandre, D. ; Olsen, S. ; Andrieu, F. ; Poiroux, T. ; Kilchytska, V.

  • Author_Institution
    Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
  • fYear
    2011
  • fDate
    3-6 Oct. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Ultra-thin body with ultra-thin buried oxide (UTBB) n-channel devices on silicon-on-insulator platform with and without ground plane are characterised over a wide frequency range. Self-heating effect and source-to-drain coupling through the substrate clearly manifest themselves through the output conductance variation with frequency. In this work, we experimentally show that introduction of a p-type ground plane (GP) significantly reduces output conductance degradation with frequency and results in improved analogue performance comparing with devices without GP.
  • Keywords
    MOSFET; electric admittance; silicon-on-insulator; UTBB SOI MOSFET; output conductance degradation reduction; output conductance variation; p-type ground plane; self-heating effect; silicon-on-insulator platform; small-signal output conductance frequency dependence; source-to-drain coupling; ultra-thin body device; ultra-thin buried oxide n-channel device; Couplings; Degradation; Logic gates; MOSFETs; Performance evaluation; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2011 IEEE International
  • Conference_Location
    Tempe, AZ
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-61284-761-0
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2011.6081717
  • Filename
    6081717