Title : 
4F-5 An Improvement of the Picosecond Ultrasonic Technique Based on a Tunable Laser: Application to Bulk Acoustic Wave Resonator Characterizations
         
        
            Author : 
Devos, Arnaud ; Emery, Patrick ; Caruyer, Grégory ; Ancey, Pascal
         
        
            Author_Institution : 
Inst. d´´Electronique, de Micro-electronique et de Nanotechnologie, Lille
         
        
        
        
        
        
            Abstract : 
The control of the frequency is a challenging question for the mass production of bulk acoustic wave (BAW) filters. It passes through a precise control of mechanical properties of the active layer but also of the thicknesses of the whole stack. But performing mechanical measurements at such a scale is not so easy and we may say that BAW resonators constitute a challenging object for metrology. Picosecond ultrasonics is an optical technique which uses ultrashort optical pulses to generate and detect very short acoustic pulses. It is a non-contact and non-destructive technique that is well adapted to mechanical measurements in thin films. Here we show that this technique is a well-adapted tool for the control of BAW technology. Furthermore, we propose an improvement of this technique based on the use of a tunable laser which offers two major improvements of the technique, the first being the number of measured parameters and the second being the measurement precision
         
        
            Keywords : 
acoustic resonators; bulk acoustic wave devices; ultrasonic devices; BAW technology; bulk acoustic wave filters; bulk acoustic wave resonator; noncontact technique; nondestructive technique; picosecond ultrasonic technique; tunable laser; Acoustic measurements; Acoustic waves; Frequency; Laser applications; Mechanical variables measurement; Optical resonators; Tunable circuits and devices; Ultrasonic imaging; Ultrasonic variables measurement; Weight control;
         
        
        
        
            Conference_Titel : 
Ultrasonics Symposium, 2006. IEEE
         
        
            Conference_Location : 
Vancouver, BC
         
        
        
            Print_ISBN : 
1-4244-0201-8
         
        
            Electronic_ISBN : 
1051-0117
         
        
        
            DOI : 
10.1109/ULTSYM.2006.149