Title :
Dual Edge Triggered Flip-Flops for Noise Aware Design
Author_Institution :
Fac. of Syst. Design, Tokyo Metropolitan Univ., Tokyo, Japan
Abstract :
This paper proposes dependable flip-flop design, dual edge triggered flip-flops, taking into account of noise induced on data signal lines. The clock signal has two edges in nature. If an edge triggered flip-flop can sample data by using two clock edges of both rising and falling, the flip-flop has the highly ability to prevent sampling a noise signal on the data line.
Keywords :
flip-flops; integrated circuit noise; logic design; radiation hardening (electronics); clock signal; dual edge triggered flip-flops; noise aware design; noise signal; Clocks; Computational modeling; Delay; Flip-flops; Noise; Transient analysis; data signal; dependable design; edge triggered flip-flop; noise; synchronous circuits;
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
Print_ISBN :
978-1-4577-0483-3
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETS.2011.28