• DocumentCode
    2349925
  • Title

    Contributions from the DOE center for semiconductor modeling and simulation

  • Author

    Albers, R.C. ; Cartwright, D.C. ; George, D.C. ; Kress, J.D. ; Kwan, T.J. ; Nebel, R.A. ; Soran, P.D. ; Straub, G.K. ; Trease, H.E. ; Walker, R.B. ; Hays, G.N.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • fYear
    1995
  • fDate
    16-17 May 1995
  • Firstpage
    172
  • Lastpage
    181
  • Abstract
    The US Department of Energy (DOE) and the Semiconductor Research Corporation (SRC) have recently initiated a five-year program, which combines the semiconductor expertise of the SRC with the DOE National Laboratory capabilities in high performance computing, to provide more predictive, advanced technology, modeling and simulation tools for the semiconductor industry. The need for these tools and five initial project thrust areas are described: topography, bulk processes, grids and computational science, interconnects, and devices
  • Keywords
    digital simulation; electronic engineering computing; etching; integrated circuit interconnections; integrated circuit manufacture; ion implantation; mesh generation; research initiatives; semiconductor doping; semiconductor process modelling; simulation; surface topography; vapour deposition; IC fabrication; IC technology; Semiconductor Research Corporation; US DOE center; US Department of Energy; bulk processes; high performance computing; interconnects; semiconductor modeling; simulation tools; topography; Application specific integrated circuits; Circuit simulation; Computational modeling; Costs; Electronics industry; Integrated circuit modeling; Integrated circuit technology; Laboratories; Predictive models; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 1995., Proceedings of the Eleventh Biennial
  • Conference_Location
    Austin, TX
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-2596-6
  • Type

    conf

  • DOI
    10.1109/UGIM.1995.514140
  • Filename
    514140