Abstract :
The following topics are dealt with: power switches; security; converter testing; 3D technology; emerging technologies; mixed-signal testing; RF testing; dependability; test data compression; test data compaction; diagnosis; advances in test; contactless testing; memory testing; ATPG; analog production test; and post silicon debug.
Keywords :
automatic test pattern generation; circuit testing; convertors; data compression; mixed analogue-digital integrated circuits; switches; 3D technology; ATPG; RF testing; advances in test; analog production test; contactless testing; converter testing; dependability; diagnosis; emerging technologies; memory testing; mixed signal testing; post silicon debug; power switches; security; test data compaction; test data compression;
Conference_Titel :
Test Symposium (ETS), 2011 16th IEEE European
Conference_Location :
Trondheim
Print_ISBN :
978-1-4577-0483-3
