DocumentCode :
2350144
Title :
Electrical testing and simulation in the Microelectronic Engineering Department at RIT
Author :
Pearson, Robert ; Hildreth, Scott ; Smeenge, J.M. ; Kroezen, Harm
Author_Institution :
Dept. of Microelectron. Eng., Rochester Inst. of Technol., NY, USA
fYear :
1995
fDate :
16-17 May 1995
Firstpage :
241
Lastpage :
244
Abstract :
The education of a microelectronic process engineer involves a number of disciplines that must be woven together in the curriculum. The overall goal that a process engineer strives for is improvement of the product. Certain classes may focus on analyzing and improving individual processes such as plasma etching. The data collected for an individual process may not be easy to link to final product performance parameters. The final product´s improvement is typically monitored by measurement of device or circuit electrical parameters. Electrical testing done in manufacturing classes then plays a key role in the education of a microelectronic engineer. The goal is to have the collected data tie together processing device physics, electronics and statistics course work. This paper describes the broad approach RIT has used to meet this goal
Keywords :
educational courses; electronic engineering education; integrated circuit design; integrated circuit manufacture; integrated circuit testing; production testing; IC testing; Microelectronic Engineering Department; education; electrical testing; manufacturing classes; microelectronic process engineers; simulation; Condition monitoring; Educational products; Etching; Microelectronics; Plasma applications; Plasma devices; Plasma materials processing; Plasma measurements; Plasma simulation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1995., Proceedings of the Eleventh Biennial
Conference_Location :
Austin, TX
ISSN :
0749-6877
Print_ISBN :
0-7803-2596-6
Type :
conf
DOI :
10.1109/UGIM.1995.514153
Filename :
514153
Link To Document :
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