Title :
Wideband RF-MEMS shunt switches with high reliability for microwave and millimeter wave applications
Author :
Onodera, Kazumasa ; Zhang, Yi ; Maeda, Ryutaro
Keywords :
Dielectrics and electrical insulation; Insertion loss; Millimeter wave technology; Radio frequency; Radiofrequency microelectromechanical systems; Stress; Switches; Switching circuits; Ultra wideband technology; Voltage;
Conference_Titel :
Wireless and Microwave Technology, 2005. WAMICON 2005. The 2005 IEEE Annual Conference
Print_ISBN :
0-7803-8861-5
DOI :
10.1109/WAMIC.2005.1528418
