Title :
Scattering parameter analysis of periodic waveguides for cyclotron masers
Author_Institution :
High-Power Microwave Lab., Tel Aviv Univ., Israel
Abstract :
A novel technique to analyze the dispersion relations and the circuit parameters of periodic waveguides is presented. This technique is based on insertion measurements of the periodic waveguide resonance frequencies by a scalar network analyzer. This method was developed for the analysis of metal-post periodic waveguide used in cyclotron resonance maser experiments conducted at MIT and at Tel Aviv University. The analysis provides the dispersion relations and the posts normalized equivalent reactances with an accuracy of 0.001 and 0.003, respectively.
Keywords :
S-parameters; cyclotron masers; dispersion (wave); dispersion relations; rectangular waveguides; waveguide theory; circuit parameters; cyclotron masers; dispersion relations; insertion measurements; metal-post periodic waveguide; periodic waveguides; posts normalized equivalent reactances; scalar network analyzer; scattering parameter analysis; waveguide resonance frequencies; Circuits; Cyclotrons; Dispersion; Impedance; Loaded waveguides; Masers; Power engineering and energy; Resonance; Scattering parameters; Waveguide theory;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1995., Eighteenth Convention of
Conference_Location :
Tel Aviv, Israel
Print_ISBN :
0-7803-2498-6
DOI :
10.1109/EEIS.1995.514168
