DocumentCode
2350879
Title
Study of natural space radiation effects in semiconductor devices for selection of electronic parts
Author
Levinson, J. ; Barak, J. ; Akkerman, A. ; Zilberman, D. ; Zentner, A. ; David, D. ; Lifshitz, Y.
Author_Institution
Soreq Nucl. Res. Center, Yavne, Israel
fYear
1995
fDate
7-8 March 1995
Abstract
Studies at Soreq NRC related to space radiation effects on semiconductor devices (that may lead to the failure of electronic systems) are discussed. The infrastructure of Soreq used for these studies, including: (i) a database of radiation effects in electronic devices and (ii) test facilities, is described. Examples of tests manifesting the importance of acquiring data on devices of the specific lot to be used are given.
Keywords
aerospace test facilities; aerospace testing; radiation effects; semiconductor device testing; space vehicle electronics; Soreq NRC; electronic parts; natural space radiation effects; semiconductor devices; test facilities; Degradation; Electron traps; Ionizing radiation; Leakage current; Protons; Radiation effects; Semiconductor devices; Single event upset; Space technology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Electronics Engineers in Israel, 1995., Eighteenth Convention of
Conference_Location
Tel Aviv, Israel
Print_ISBN
0-7803-2498-6
Type
conf
DOI
10.1109/EEIS.1995.514196
Filename
514196
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