Title :
Study of natural space radiation effects in semiconductor devices for selection of electronic parts
Author :
Levinson, J. ; Barak, J. ; Akkerman, A. ; Zilberman, D. ; Zentner, A. ; David, D. ; Lifshitz, Y.
Author_Institution :
Soreq Nucl. Res. Center, Yavne, Israel
Abstract :
Studies at Soreq NRC related to space radiation effects on semiconductor devices (that may lead to the failure of electronic systems) are discussed. The infrastructure of Soreq used for these studies, including: (i) a database of radiation effects in electronic devices and (ii) test facilities, is described. Examples of tests manifesting the importance of acquiring data on devices of the specific lot to be used are given.
Keywords :
aerospace test facilities; aerospace testing; radiation effects; semiconductor device testing; space vehicle electronics; Soreq NRC; electronic parts; natural space radiation effects; semiconductor devices; test facilities; Degradation; Electron traps; Ionizing radiation; Leakage current; Protons; Radiation effects; Semiconductor devices; Single event upset; Space technology; Testing;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1995., Eighteenth Convention of
Conference_Location :
Tel Aviv, Israel
Print_ISBN :
0-7803-2498-6
DOI :
10.1109/EEIS.1995.514196
