DocumentCode :
2351104
Title :
6I-4 Integrated Micromechanical Circuits Fueled By Vibrating RF MEMS Technology (Invited)
Author :
Nguyen, Clark T C
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA
fYear :
2006
fDate :
2-6 Oct. 2006
Firstpage :
957
Lastpage :
966
Abstract :
Having now produced devices with sufficient Q, thermal stability, aging stability, and manufacturability, vibrating RF MEMS technology is already finding its way into next generation timing and wireless applications. At this juncture, the technology is now poised to take its next logical steps: higher levels of circuit complexity and integration. In particular, as vibrating RF MEMS devices are perceived more as circuit building blocks than as stand-alone devices, and as the frequency processing circuits they enable become larger and more complex, the makings of an integrated micromechanical circuit technology begin to take shape, perhaps with a functional breadth to rival that of integrated transistor circuits. After briefly reviewing the present state of vibrating RF MEMS device technology, this paper suggests the mechanical circuit element attributes most likely to insure a broad functional range for future integrated micromechanical circuits
Keywords :
VLSI; large scale integration; micromechanical devices; radiofrequency integrated circuits; LSI; VLSI; aging stability; circuit complexity; circuit integration; integrated micromechanical circuits; integrated transistor circuits; mechanical circuit; oscillator; quality factor; resonator; thermal stability; vibrating RF MEMS technology; wireless communications; Aging; Circuit stability; Complexity theory; Frequency; Integrated circuit technology; Manufacturing; Micromechanical devices; Radiofrequency microelectromechanical systems; Thermal stability; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
ISSN :
1051-0117
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2006.224
Filename :
4152080
Link To Document :
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