DocumentCode
2351213
Title
Flux-free process for placement and attach of solder balls to wafers, flip chips and all BGA packages
Author
Ramos, Richard
Author_Institution
Scientific Sealing Technol., Downey, CA, USA
fYear
1998
fDate
19-21 Oct 1998
Firstpage
24
Lastpage
33
Abstract
The current method used by industry for solder ball placement and attachment on wafers and BGA packages produces unacceptable production yields, as the existing process requires the use of flux. When flux liquefies during reflow soldering, the bonds between the flux, balls and pads are destroyed and the balls are free to move. Defects such as vacancies, adjacent ball bridging, loss of positional accuracy and voids are created. Also, flux residues are not always completely removed during post-solder cleaning processes due to these voids, and high resistance shorts and/or corrosion may result. Demand for flip chip technology and BGA devices has steadily increased and more efficient high volume manufacturing assembly methods must be developed to keep pace. Ball attachment production yields also must be improved so that manufacturing costs can be reduced. In response, SST has developed a new and more cost-effective method of solder ball placement and attachment to wafers and to plastic and ceramic packages for BGA applications. The new method virtually eliminates the problems associated with the current methods. The SST process uses specially designed tooling for loading and precise holding of solder balls in the required position during processing. The soldering operation is performed without flux in a controlled atmosphere. As a result, pre-solder paste screening and post-solder cleaning operations are not required. The SST ball attachment process for wafers is performed at the wafer level prior to singulation, thereby maximizing production capability. The ball attachment process for BGA packages is also very efficient
Keywords
ball grid arrays; ceramic packaging; corrosion; flip-chip devices; integrated circuit packaging; microassembling; plastic packaging; soldering; surface chemistry; surface cleaning; surface contamination; voids (solid); BGA devices; BGA packages; SST ball attachment process; adjacent ball bridging; ceramic packages; controlled atmosphere; corrosion; cost-effective method; flip chip technology; flip chips; flux liquefication; flux residues; flux-free solder ball placement/attachment process; high resistance shorts; plastic packages; positional accuracy; post-solder cleaning; post-solder cleaning processes; pre-solder paste screening; production capability; production yield; singulation; solder ball attachment; solder ball attachment production yields; solder ball loading; solder ball placement; solder ball positioning; solder balls; solder defects; solder flux; solder pads; soldering operation; tooling; vacancies; voids; volume manufacturing assembly methods; wafer level attachment; wafers; Assembly; Cleaning; Corrosion; Costs; Flip chip; Manufacturing; Packaging; Plastics; Production; Reflow soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
Conference_Location
Austin, TX
ISSN
1089-8190
Print_ISBN
0-7803-4523-1
Type
conf
DOI
10.1109/IEMT.1998.731008
Filename
731008
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