• DocumentCode
    2351375
  • Title

    Automated visual inspection of surface mounted chip components

  • Author

    Wu, Huihui ; Feng, Guanglin ; Li, Huiwen ; Zeng, Xianrong

  • Author_Institution
    Shunde Polytech., Foshan, China
  • fYear
    2010
  • fDate
    4-7 Aug. 2010
  • Firstpage
    1789
  • Lastpage
    1794
  • Abstract
    In order to develop the reliable and fast visual inspection techniques for surface mounted components after they have been placed in wet solder paste on a printed circuit board (PCB). An inspection process based on machine vision is presented. First, with an adaptive segmentation method based on local valley, the binary component electrodes were obtained, at the same, the location of the component was gotten by the sliding location window algorithm, then, the defects such as component missing, component rotation and component shift are detected by analyzing the projection information of the electrodes. Second, the three color features are extracted from the component body and the Bayes classifier is used to inspect whether the components body is wrong. The experiment results have verified the validity of this scheme in terms of recognition rate and speed.
  • Keywords
    Bayes methods; computer vision; feature extraction; image segmentation; inspection; printed circuits; surface mount technology; Bayes classifier; adaptive segmentation; automated visual inspection; color feature extraction; machine vision; printed circuit board; sliding location window algorithm; surface mounted chip component; wet solder paste; Electrodes; Histograms; Image color analysis; Image segmentation; Inspection; Pixel; Training; Bayes classifier; Surface mounted components; electrodes; integral projection; machine vision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronics and Automation (ICMA), 2010 International Conference on
  • Conference_Location
    Xi´an
  • ISSN
    2152-7431
  • Print_ISBN
    978-1-4244-5140-1
  • Electronic_ISBN
    2152-7431
  • Type

    conf

  • DOI
    10.1109/ICMA.2010.5588029
  • Filename
    5588029