DocumentCode :
2351898
Title :
P1H-1 Scattering Parameters Measurement for the Determination of Layered Media Properties with 25 Mhz Ultrasound
Author :
Ermert, H. ; Vogt, M.
Author_Institution :
Inst. of High Frequency Eng., Ruhr Univ. Bochum
fYear :
2006
fDate :
2-6 Oct. 2006
Firstpage :
1402
Lastpage :
1405
Abstract :
Non destructive evaluation (NDE) of layered media is of interest in many applications like food packaging and coating of substrates. In this paper, an approach for the measurement and reconstruction of acoustic parameters and thicknesses of layered media with high-frequency ultrasound (HFUS) in the 25 MHz range is presented. Ultrasonic two-port measurements are performed analog to conventional network analysis (NWA) of electrical networks in high-frequency metrology. A linear network model is employed to reconstruct layered media, which consist of discrete layers connected in series. Simulations and measurements, which were performed to evaluate the approach, are presented. The potential and limitations of the proposed technique is discussed
Keywords :
food technology; inhomogeneous media; substrates; ultrasonic materials testing; ultrasonic measurement; ultrasonic scattering; 25 MHz; acoustic parameter reconstruction; food packaging; high-frequency metrology; high-frequency ultrasound; layered media properties; linear network model; nondestructive evaluation; scattering parameters measurement; substrate coating; ultrasonic two-port measurement; Acoustic measurements; Coatings; Electric variables measurement; Nonhomogeneous media; Packaging; Performance evaluation; Scattering parameters; Thickness measurement; Ultrasonic imaging; Ultrasonic variables measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
ISSN :
1051-0117
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2006.271
Filename :
4152127
Link To Document :
بازگشت