Title :
Novel trace design for high data-rate multi-channel optical transceiver assembled using flip-chip bonding
Author :
Yagisawa, Takatoshi ; Shiraishi, Tomohiro ; Sugawara, Mariko ; Tanaka, Kiyoshi
Author_Institution :
Fujitsu Labs. Ltd., Kawasaki, Japan
Abstract :
We propose a trace design for high data-rate multichannel optical transceiver assembled using flip-chip bonding technology. The trace, which is formed on a transceiver substrate, compensates for bandwidth degradation due to the parasitic capacitance of the flip-chip bonding pad for optical and electrical devices. The trace was adopted to the receiver side of a flexible-printed-circuit-based optical engine that consists of a 25-μm-thick flexible printed circuit substrate on which a vertical-cavity surface-emitting laser array, driver, photodiode array, and transimpedance amplifier are mounted by flip-chip bonding. The polymer waveguide is laminated from the backside of the substrate via microlens-imprinted film for optical coupling. The sensitivity degradation caused by the parasitic capacitance was successfully suppressed to 0.6 dB at 40 Gb/s by using our trace design compared to that with a minimum length wire bonding connection.
Keywords :
flexible electronics; flip-chip devices; integrated circuit bonding; operational amplifiers; optical interconnections; optical transceivers; printed circuits; substrate integrated waveguides; bandwidth degradation; electrical devices; flexible printed circuit based optical engine; flip-chip bonding technology; high data rate multichannel optical transceiver; microlens-imprinted film; optical coupling; optical devices; parasitic capacitance; photodiode array; polymer waveguide; size 25 mum; trace design; transceiver substrate; transimpedance amplifier; vertical-cavity surface-emitting laser array; wire bonding connection; Bonding; Cathodes; Flip-chip devices; Optical sensors; Optical transmitters; Substrates; Vertical cavity surface emitting lasers;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
DOI :
10.1109/ECTC.2014.6897417