DocumentCode
2352113
Title
Silicon-on-quartz for low power electronic applications
Author
Sarma, Kalluri R. ; Liu, S.T.
Author_Institution
Honeywell Inc., Phoenix, AZ, USA
fYear
1994
fDate
3-6 Oct 1994
Firstpage
117
Lastpage
118
Abstract
We have developed a novel Silicon-on-Quartz (SOQ) technology for fabricating SOI devices and circuits for low power electronics applications. SOQ substrate is fabricated by direct bonding of a silicon wafer with an etch-stop layer, and a quartz wafer, at room temperature, followed by thinning using surface grinding and selective etching techniques. We have successfully fabricated SOQ CMOS devices and demonstrated transistors with high mobility and low leakage currents. Thermal stress management techniques employed for the successful fabrication of the SOQ CMOS devices and the advantages of the SOQ approach for low power electronics are discussed
Keywords
MOSFET; etching; quartz; semiconductor technology; silicon-on-insulator; wafer bonding; CMOS devices; SOI devices; SOQ technology; Si-SiO2; direct bonding; etch-stop layer; leakage currents; low power electronics; mobility; selective etching; silicon wafer; silicon-on-quartz; surface grinding; thermal stress management; thinning; transistors; CMOS technology; Circuits; Etching; Leakage current; Low power electronics; Silicon; Temperature; Thermal management of electronics; Thermal stresses; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1994 Proceedings., 1994 IEEE International
Conference_Location
Nantucket, MA
Print_ISBN
0-7803-2406-4
Type
conf
DOI
10.1109/SOI.1994.514274
Filename
514274
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