• DocumentCode
    2352113
  • Title

    Silicon-on-quartz for low power electronic applications

  • Author

    Sarma, Kalluri R. ; Liu, S.T.

  • Author_Institution
    Honeywell Inc., Phoenix, AZ, USA
  • fYear
    1994
  • fDate
    3-6 Oct 1994
  • Firstpage
    117
  • Lastpage
    118
  • Abstract
    We have developed a novel Silicon-on-Quartz (SOQ) technology for fabricating SOI devices and circuits for low power electronics applications. SOQ substrate is fabricated by direct bonding of a silicon wafer with an etch-stop layer, and a quartz wafer, at room temperature, followed by thinning using surface grinding and selective etching techniques. We have successfully fabricated SOQ CMOS devices and demonstrated transistors with high mobility and low leakage currents. Thermal stress management techniques employed for the successful fabrication of the SOQ CMOS devices and the advantages of the SOQ approach for low power electronics are discussed
  • Keywords
    MOSFET; etching; quartz; semiconductor technology; silicon-on-insulator; wafer bonding; CMOS devices; SOI devices; SOQ technology; Si-SiO2; direct bonding; etch-stop layer; leakage currents; low power electronics; mobility; selective etching; silicon wafer; silicon-on-quartz; surface grinding; thermal stress management; thinning; transistors; CMOS technology; Circuits; Etching; Leakage current; Low power electronics; Silicon; Temperature; Thermal management of electronics; Thermal stresses; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1994 Proceedings., 1994 IEEE International
  • Conference_Location
    Nantucket, MA
  • Print_ISBN
    0-7803-2406-4
  • Type

    conf

  • DOI
    10.1109/SOI.1994.514274
  • Filename
    514274