Title :
Evaluation of manufacturing handling characteristics of hydrogen peroxide-based tungsten CMP slurry
Author :
Bare, John P. ; Johl, Budge
Author_Institution :
FSI Int. Inc., Hollister, CA, USA
Abstract :
In a typical production-scale fab, CMP slurry will circulate through a bulk delivery system and fab piping approximately 100 times before being consumed. During these “turnovers”, the slurry will encounter abuse from many sources, including decomposition of constituents. Change in any physical or chemical property during its lifetime, particularly hydrogen peroxide (H2O2) concentration, may affect polishing performance. In this paper, a commercially available CMP slurry used for tungsten polishing was subjected to an accelerated aging and handling evaluation to determine its handling characteristics in a bulk slurry distribution system used in semiconductor manufacturing. In this accelerated aging test, Cabot SemiSperseR W-2000 was subjected to 3000 storage tank turnovers during a seven-day test period while monitoring slurry health parameters, including pH, density, weight percent solids, and particle size distribution. During this period, the slurry showed minimal changes in all normal slurry health parameters. The H2O2 oxidizer did decompose as expected, but was readily replenished by following the manufacturer´s recommendations of periodic assay analysis and dosing with replenishing H2O2. Cabot Semi-SperseR W-2000 tungsten polishing slurry with H2 O2 oxidizer should be compatible with bulk slurry delivery systems, especially those using vacuum-pressure dispense engines
Keywords :
ageing; chemical mechanical polishing; chemical technology; hydrogen compounds; integrated circuit interconnections; integrated circuit metallisation; integrated circuit testing; life testing; materials handling; oxidation; surface chemistry; tungsten; CMP slurry; CMP slurry circulation; CMP slurry consumption; Cabot SemiSperse W-2000 slurry; H2O2; H2O2 concentration; H2O2 oxidizer; H2O2 oxidizer decomposition; H2O2 oxidizer replenishment; W; accelerated aging; accelerated aging test; bulk delivery system; bulk slurry delivery systems; bulk slurry distribution system; fab piping; handling characteristics; handling evaluation; hydrogen peroxide concentration; hydrogen peroxide-based tungsten CMP slurry; manufacturing handling characteristics; polishing performance; production-scale fab; semiconductor manufacturing; slurry constituent decomposition; slurry density; slurry health parameters; slurry pH; slurry particle size distribution; slurry weight percent solids; storage tank turnover; tungsten polishing; vacuum-pressure dispense engines; Accelerated aging; Chemicals; Condition monitoring; Hydrogen; Pulp manufacturing; Semiconductor device manufacture; Slurries; Solids; Testing; Tungsten;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-4523-1
DOI :
10.1109/IEMT.1998.731072