DocumentCode
235250
Title
Capping technologies for wafer level MEMS packaging based on permanent and temporary wafer bonding
Author
Zoschke, K. ; Wilke, M. ; Wegner, M. ; Kaletta, K. ; Manier, C.-A. ; Oppermann, H. ; Wietstruck, M. ; Tillack, Bernd ; Kaynak, Mehmet ; Lang, K.-D.
Author_Institution
Fraunhofer IZM, Berlin, Germany
fYear
2014
fDate
27-30 May 2014
Firstpage
1204
Lastpage
1211
Abstract
This paper describes techniques for the miniaturized, low-cost wafer level chip-scale packaging of MEMS based system in packages (SiPs). The approaches comprise permanent bonding of cap structures using adhesives or solder onto a passive or active silicon wafer which is populated with MEMS components or which is itself a MEMS wafer. The paper addresses different options for manufacturing of lid or cap structures and their subsequent bonding to the partner wafer. Different technologies like bonding of full area cap wafers as well as partial capping approaches based on reconfigured cap structures on a help wafer or cap structures created on a compound wafer are presented. Examples like the selective capping process for RF-MEMS switches are discussed in detail. All processes were performed at 200 mm wafer scale.
Keywords
chip scale packaging; microswitches; system-in-package; wafer bonding; wafer level packaging; MEMS based system in packages; MEMS components; MEMS wafer; RF-MEMS switches; SiP; active silicon wafer; compound wafer; full area cap wafers; help wafer; low-cost wafer level chip-scale packaging; partial capping approaches; passive silicon wafer; permanent bonding; reconfigured cap structures; size 200 mm; Bonding; Cavity resonators; Glass; Micromechanical devices; Silicon; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897444
Filename
6897444
Link To Document