• DocumentCode
    2352531
  • Title

    Packaging requirements and solutions for CMOS imaging sensors

  • Author

    Sengupta, K. ; Sundahl, R. ; Kawashima, S. ; Arellano, R. ; Sklenicka, C. ; Thompson, D.

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    1998
  • fDate
    19-21 Oct 1998
  • Firstpage
    194
  • Lastpage
    198
  • Abstract
    Image sensors place additional demands on packaging technology, beyond those for conventional ICs, including (1) an optical quality window, (2) precision mechanical die alignment, and (3) protection of die imaging attributes from environmental and manufacturing effects. In our development of CMOS sensors, we chose a commercially available package, the windowed QFP, as the basis for the CMOS sensor package. A pre-molded epoxy cavity package provides moisture protection similar to that for ceramic packages. Control of the tip and tilt components of die/package alignment and the tolerance stack-up between die and lens enables simple lens system alignment. The ceramic/glass lid maintains moisture protection while providing superior thermomechanical performance. This packaging technology gives customers a major advantage in board assembly with a mass reflow capable package that is unique in the industry
  • Keywords
    CMOS image sensors; assembling; environmental degradation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; moulding; plastic packaging; reflow soldering; CCD devices; CMOS image sensor; CMOS imaging sensors; CMOS sensor package; CMOS sensors; CMOS-based technology; board assembly; camera system function integration; ceramic packages; ceramic/glass lid; die imaging attributes; die imaging protection; die/lens tolerance stack-up; die/package alignment; digital imaging; environmental effects; image sensors; lens system alignment; manufacturing effects; market segment; mass reflow capable package; mechanical die alignment; moisture protection; optical quality window; packaging; packaging technology; pre-molded epoxy cavity package; product cost; product goals; product performance; thermomechanical performance; volume sensor manufacture; windowed QFP; CMOS image sensors; Ceramics; Image sensors; Lenses; Mechanical sensors; Moisture; Optical imaging; Packaging; Protection; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-4523-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1998.731075
  • Filename
    731075