• DocumentCode
    2352569
  • Title

    A More Precise Abstract Domain for Multi-level Caches for Tighter WCET Analysis

  • Author

    Sondag, Tyler ; Rajan, Hridesh

  • Author_Institution
    Dept. of Comput. Sci., Iowa State Univ., Ames, IA, USA
  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 3 2010
  • Firstpage
    395
  • Lastpage
    404
  • Abstract
    As demand for computational power of embedded applications has increased, their architectures have become more complex. One result of this increased complexity are real-time embedded systems with set-associative multi-level caches. Multi-level caches complicate the process of program analysis techniques such as worst case execution time (WCET). To address this need we have developed a sound cache behavior analysis that handles multi-level instruction and data caches. Our technique relies on a new abstraction, live caches, which models relationships between cache levels to improve accuracy. Our analysis improves upon previous multi-level cache analysis in three ways. First, it handles write-back, a common feature of cache models, soundly. Second, it handles both instruction and data cache hierarchies, and third, it improves precision of cache analysis. For standard WCET benchmarks and a multi-level cache configuration analyzed by previous work, we observed that live caches improve WCET precision resulting in an average of 6.3% reduction in computed WCET.
  • Keywords
    cache storage; embedded systems; instruction sets; memory architecture; program diagnostics; WCET analysis; architectures; computational power; data cache hierarchies; multilevel cache configuration; multilevel instruction; precise abstract domain; program analysis techniques; real-time embedded systems; set-associative multilevel caches; worst case execution time; write-back feature; Cache; Static analysis; abstract interpretation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real-Time Systems Symposium (RTSS), 2010 IEEE 31st
  • Conference_Location
    San Diego, CA
  • ISSN
    1052-8725
  • Print_ISBN
    978-0-7695-4298-0
  • Type

    conf

  • DOI
    10.1109/RTSS.2010.8
  • Filename
    5702248