DocumentCode :
235262
Title :
Experimental demonstration of the effect of copper TPVs (Through package vias) on thermal performance of glass interposers
Author :
Sangbeom Cho ; Sato, Yuuki ; Sundaram, Venky ; Joshi, Yash ; Tummala, Rao
Author_Institution :
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1247
Lastpage :
1252
Abstract :
Glass has been proposed to be an ideal material for interposers to address the limits of both organic and silicon, except for its poor thermal conductivity compared to silicon. This paper proposes to use large number of copper through package vias (TPVs) that can be fabricated at low cost to improve this shortcoming. We report on experimental fabrication and evaluation of the effect of copper TPVs on thermal performance of glass interposer structures. Copper via arrays with different via densities (0.62 vias/mm2 ~ 22 vias/mm2) were fabricated in glass interposer structures by using low cost laser drilling and electroplating. The thermal performance of such structures was quantified by measuring spatial temperature distribution, including the maximum value around the heat source. This study provides fundamental understanding of heat transfer within thermally-enhanced glass interposers, and offers guidelines for the design of copper via arrays to improve their thermal properties.
Keywords :
copper; electronics packaging; electroplating; glass; heat transfer; laser beam machining; temperature distribution; thermal conductivity; Cu; copper TPVs effect; copper through package vias; copper via arrays; electroplating; glass interposer structures; heat source; heat transfer; low cost laser drilling; spatial temperature distribution measurement; thermal conductivity; thermal performance; thermal properties; thermally-enhanced glass interposers; Copper; Glass; Resistance heating; Temperature measurement; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897451
Filename :
6897451
Link To Document :
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