Title :
Monte Carlo calculation of X-ray spectra emitted by various anode materials at low voltages
Author :
Wilderman, Scott J. ; Hames, Sean M. ; Flynn, Michael J. ; Martin, William R.
Author_Institution :
Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI, USA
fDate :
30 Oct-5 Nov 1994
Abstract :
Calculations of the absolute intensity and energy spectra of X-rays emitted by various targets have been performed for tube potentials in the 20-50 kV range using a single scattering Monte Carlo method. Monte Carlo modeling provides an accurate, practical method for obtaining X-ray spectra from arbitrary target materials for which experimental or semi-empirical results are not available. Our Monte Carlo program, SKEPTIC (Simulated Kilovolt Electron and Photon Transport In Condensed media), utilizes fast sampling schemes and employs extensive variance reduction techniques in order to reduce run time inefficiencies normally associated with single scattering electron transport simulations. Cross section data in the SKEPTIC physics model is taken from the partial wave elastic scattering formulation of Riley (1975) and the doubly differential bremsstrahlung description due to Pratt et al. (1977). Calculated spectra and intensities compare well with available experimental data
Keywords :
Monte Carlo methods; X-ray emission spectra; X-ray tubes; anodes; biomedical equipment; diagnostic radiography; medical computing; photon transport theory; spectroscopy computing; 20 to 50 kV; Monte Carlo calculation; Monte Carlo modeling; SKEPTIC; Simulated Kilovolt Electron and Photon Transport In Condensed media; X-ray spectra; absolute intensity; anode materials; arbitrary target materials; doubly differential bremsstrahlung; energy spectra; fast sampling schemes; low voltages; mammography tubes; partial wave elastic scattering formulation; run time inefficiencies; single scattering Monte Carlo method; tube potentials; variance reduction techniques; Anodes; Electromagnetic scattering; Electrons; Image edge detection; Low voltage; Monte Carlo methods; Particle scattering; Physics; Sampling methods; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-2544-3
DOI :
10.1109/NSSMIC.1994.474769
