Title :
An efficient method for improving the quality of per-test fault diagnosis
Author_Institution :
Dept. of Comput. & Electron. Eng., Nebraska-Lincoln Univ., Omaha, NE, USA
Abstract :
Per-test fault diagnosis methodology has been shown to be an effective one for the identification of complex defects. We improve a recent per-test technique by applying additional diagnosis on the outputs of the circuit. The new method brings in more evidence to support the true failures, hence improves the diagnostic quality. We show that this method can very well address several problems in previous work.
Keywords :
fault diagnosis; integrated circuit testing; logic testing; diagnostic quality; fault testing methods; integrated circuit testing; per-test fault diagnosis; Algorithm design and analysis; Circuit faults; Circuit testing; Failure analysis; Fault diagnosis; Test pattern generators;
Conference_Titel :
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
Print_ISBN :
0-7803-8702-3
DOI :
10.1109/ICCAD.2004.1382655
