DocumentCode
2352879
Title
Aging time effect on PD and space charge behavior in magnet wire under high PWM voltages
Author
Zhou, Kai ; Wu, Guanning ; Deng, Tao ; Wu, Jiandong
Author_Institution
Coll. of Electr. Eng., Southwest Jiaotong Univ., Sichuan
fYear
2006
fDate
11-14 June 2006
Firstpage
159
Lastpage
162
Abstract
It has been observed that voltage waveforms generated by power electronic converters may affect significantly the reliability of electric motor insulation. The electrical characterization of magnet wire for electric motor has been carried out through aging tests under different aging time. We have measured the space charge parameter (e.g., the number of charge, trapping energy) in magnet wire under pulse width modulated (PWM) voltages by thermally stimulated current (TSC) method in order to show correlation between trapping parameter and time to aging. Also, partial discharge quantities (e.g., inception voltage, repetition frequency, phase distribution of discharge) have been measured in this paper. In particular, a relationship between time to ageing and the parameters of the TSC curve was observed in the sample. Relation between PD quantities with space charge accumulation has also been observed. These phenomena, if confirmed, could be used to screen new materials for PWM voltage applications
Keywords
PWM power convertors; ageing; electric motors; insulated wires; insulation testing; machine insulation; machine testing; magnetic materials; partial discharge measurement; reliability; space charge; PD; aging test; charge accumulation; electric motor insulation; electrical characterization; high PWM application; magnet wire; power electronic converter; reliability; space charge measurement; thermally stimulated current method; trapping parameter; Aging; Electric motors; Partial discharge measurement; Partial discharges; Power generation; Pulse measurements; Pulse width modulation; Space charge; Voltage; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location
Toronto, Ont.
ISSN
1089-084X
Print_ISBN
1-4244-0333-2
Type
conf
DOI
10.1109/ELINSL.2006.1665281
Filename
1665281
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