DocumentCode :
2352916
Title :
Comparison of electroluminescence of different high voltage cable materials under identical experimental conditions
Author :
Ariffin, A. Mohd ; Lewin, P.L. ; Dodd, S.J.
Author_Institution :
Sch. of Electron. & Comput. Sci., Southampton Univ.
fYear :
2006
fDate :
11-14 June 2006
Firstpage :
166
Lastpage :
169
Abstract :
Polymers used in high voltage cables have excellent short term dielectric properties such as high dielectric strength, low dielectric loss and high resistivity. Nevertheless they can be vulnerable to long term deterioration due to the continuous application of high electrical stress. Detection of electrical degradation is usually achieved when ageing is already prominent, for instance when partial discharge activity exists. One possible approach to detect early electrical degradation of polymers is known as the electroluminescence (EL) technique. This paper places emphasis on the description of an experimental arrangement for this method. It also presents the temporal and spectral characteristics of EL emitted from two different types of polymers: low density polyethylene (LDPE) and polyethylene terephthalate (PET). Measurements are made at room temperature using several thin films of both materials under various AC stresses in a excellent electrical field configuration
Keywords :
ageing; cable insulation; dielectric losses; electroluminescence; polyethylene insulation; polymer films; LDPE; ageing; dielectric loss; dielectric properties; dielectric strength; electrical degradation; electrical stress; electroluminescence measurement; high voltage cable; low density polyethylene; partial discharge; polyethylene terephthalate; resistivity; spectral characteristics; temporal characteristics; Cables; Conductivity; Dielectric breakdown; Dielectric losses; Dielectric materials; Electroluminescence; Polyethylene; Polymers; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1089-084X
Print_ISBN :
1-4244-0333-2
Type :
conf
DOI :
10.1109/ELINSL.2006.1665283
Filename :
1665283
Link To Document :
بازگشت