Title :
Session 9B: Timing Model Validation and Efficient On-Chip Test Compression
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-8702-3
DOI :
10.1109/ICCAD.2004.1382668
