Title : 
Strip grinding introduction for thin PoP
         
        
            Author : 
JinSeong Kim ; Yesul Ahn ; GyuWan Han ; Byoungwoo Cho ; Dongjoo Park ; JuHoon Yoon ; ChoonHeung Lee ; Nicholls, Lou ; Shengmin Wen
         
        
            Author_Institution : 
R&D Center, Amkor Technol. Korea Inc., Seoul, South Korea
         
        
        
        
        
        
            Abstract : 
Due to rapid growth in the mobile industry, Package-on-Package (PoP) has been widely adopted for 3D integration of logic and memory devices within mobile handsets, and other portable multimedia products, etc. Typical PoP configuration includes a logic function in the bottom package while memory dice are assembled into the top package. The TMV solution is widely adopted to reduce package warpage, to achieve a fine pitch PoP, and to stabilize stacking performance. Another big benefit of the TMV is to generate a thin structure by exposing the back side of the die using a film assist mold system. However, the trend of mobile devices is going thinner and thinner, and there is a limitation to achieve the thin PoP structure. The most difficult barrier to generate the thin PoP structure is the warpage control. In this paper, a strip grinding process is introduced as a solution to generate thinner PoP structures in overmolded packages. Applying the strip grinding process to exposed die, reducing mold clearance, and exploring double sided mold structures to reduce die/package height were also investigated.
         
        
            Keywords : 
fine-pitch technology; grinding; integrated circuit packaging; three-dimensional integrated circuits; 3D integration; double sided mold structures; film assist mold system; fine pitch PoP; mobile devices; mold clearance reduction; overmolded packages; package-on-package; strip grinding process; thin PoP structure; warpage control; Compounds; Films; Process control; Stacking; Strips; Substrates; Thickness measurement;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
         
        
            Conference_Location : 
Orlando, FL
         
        
        
            DOI : 
10.1109/ECTC.2014.6897469