DocumentCode :
235308
Title :
Design and demonstration of paper-thin and low-warpage single and 3D organic packages with chip-last embedding technology for smart mobile applications
Author :
Sung Jin Kim ; Zihan Wu ; Kobayashi, Masato ; Fuhan Liu ; Smet, Vanessa ; Raj, P. Markondeya ; Sundaram, Venky ; Tummala, Rao
Author_Institution :
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1384
Lastpage :
1388
Abstract :
This paper presents innovations and advances in demonstrating paper-thin organic packages with low warpage. These advances include: 1) Reduction in over-all substrate warpage, 2) Ultra-low stand off interconnection height, 3) Ultra-thin (30 μm core thickness) and ultra-low CTE (1-5 ppm/°C) organic substrates, 4) Assembly of large die onto the ultra-thin substrate, and 5) Assembly to form advanced package-on-package using conventional batch-type SMT reflow processes. Design, fabrication, assembly and characterization of test-vehicles demonstrating all these innovations are described in this paper. Comprehensive warpage modeling is performed by taking into account all substrate fabrication and assembly steps. The measured warpage data after package fabrication and assembly was used to refine and validate the models. Optimized geometry and material parameters are designed from the validated models.
Keywords :
integrated circuit packaging; mobile handsets; organic compounds; printed circuit interconnections; surface mount technology; three-dimensional integrated circuits; 3D organic package; SMT reflow process; chip-last embedding technology; low warpage single package; package-on-package assembly; paper thin organic package; smart mobile application; substrate warpage reduction; ultralow stand off interconnection height; ultrathin organic substrate; Assembly; Cavity resonators; Fabrication; Finite element analysis; Laminates; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897473
Filename :
6897473
Link To Document :
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