Title :
Design/process learning from electrical test
Author :
Koenemann, Bernd
Author_Institution :
Cadence Design Syst., Inc., San Jose, CA, USA
Abstract :
Modern design-for-test (DFT) practices not only simplify test generation but also make it much easier to diagnose problems uncovered in electrical test. In fact, many diagnostics steps can be automated enough to enable batch processing of large quantities of fail data captured during production test. Hidden in these fail data is very valuable information about the product design, manufacturing process, and interactions between the two. The embedded tutorial provides an overview of some of the analysis methods that are being used and/or prototyped in the industry, as well as the underlying data sharing between the design and manufacturing areas that is required for and enabled by the analyses.
Keywords :
automatic test pattern generation; design for testability; integrated circuit testing; integrated circuit yield; production testing; batch processing; data sharing; design learning; design-for-test practices; electrical test; manufacturing process; process learning; product design; production test; test generation; Circuit testing; Coupling circuits; Image analysis; Impurities; Inspection; Integrated circuit interconnections; Process design; Shape; Silicon; Vehicles;
Conference_Titel :
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
Print_ISBN :
0-7803-8702-3
DOI :
10.1109/ICCAD.2004.1382673
