Title :
Measurement of resistive and absorption currents in capacitor films up to breakdown
Author :
Xu, Chunchuan ; Boggs, Steven
Author_Institution :
Dept. of Phys. & Electr. Eng., Connecticut Univ., Storrs, CT
Abstract :
An electronic system with active feedback has been developed to facilitate measurement of resistive currents in polymer films up to breakdown. The system cancels the capacitive current actively to facilitate the measurement of the resistive current. The measured current is the result of the very rapid relaxation from a capacitive field distribution to a resistive field distribution at very high fields approaching breakdown. If the material were truly homogeneous, the resistive and capacitive field distributions would be the same. Most polymers are semicrystalline, with crystallites which have much lower conductivity than the amorphous regions with the result that the capacitive and resistive distributions are not the same. Absorption current data up to breakdown (~700 V/m) are presented for biaxially oriented polypropylene (BOPP) made by both the tenter and bubble process. These data are compared with measurements of polystyrene capacitor film which is amorphous. Transient nonlinear finite element analysis computer simulations are presented in a companion paper
Keywords :
digital simulation; electric breakdown; electric current measurement; electrical conductivity; feedback; finite element analysis; polymer films; power capacitors; transient analysis; absorption current measurement; biaxially oriented polypropylene; breakdown; bubble process; capacitive field distribution; computer simulation; conductivity; electronic system; feedback; homogeneous material; polymer film; polystyrene capacitor film; resistive current measurement; tenter process; transient nonlinear finite element analysis; Absorption; Amorphous materials; Capacitors; Conducting materials; Crystalline materials; Crystallization; Current measurement; Electric breakdown; Feedback; Polymer films;
Conference_Titel :
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
Print_ISBN :
1-4244-0333-2
DOI :
10.1109/ELINSL.2006.1665304