• DocumentCode
    2353457
  • Title

    Statistical time distribution of partial discharges under semi-square voltages

  • Author

    Lindell, Elisabeth ; Bengtsson, Tord ; Blennow, Jörgen

  • Author_Institution
    Chalmers Univ. of Technol., Gothenburg
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    290
  • Lastpage
    293
  • Abstract
    The conventional approach to detect partial discharges (PDs) relies on discrimination of PDs from the applied voltage, based on differences in their respective frequency contents. This is practically realised by means of a capacitive decoupling principle. However, due to the increased use of power electronic devices, voltages that appear in the system can contain high frequency components, which limit the possibility for the discrimination and make the use of the standard method for PD detection difficult or even impossible. It is therefore necessary to find other features of PDs that could be used in addition. One example is the statistical time distribution of PD appearance. In this study, the statistical time distribution of PD appearance was investigated for semi-square voltages with exponentially rising fronts. The test object was a needle in air, to which positive voltage waveforms with different rise times and voltage levels were applied. Voltages up to 10 kV with rise times of 60 mus-260 mus were used. A conventional PD decoupling circuit followed by on-line signal processing was employed for the detection. To quantify the occurrence of PDs, a concept of "first discharge rate" was introduced and its dependence on steepness of the applied voltage was investigated. For most combinations of voltage level and rise time, a considerable number of PDs appeared during the voltage rise. This is important to consider when designing PD measurement techniques for semi-square voltages
  • Keywords
    partial discharge measurement; signal detection; statistical distributions; PD measurement; capacitive decoupling; partial discharge detection; power electronic device; semisquare voltage; signal processing; statistical time distribution; Circuit testing; Dielectric liquids; Frequency measurement; Insulation; Needles; Partial discharges; Power electronics; Pulse measurements; Shape measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665314
  • Filename
    1665314