DocumentCode :
2353558
Title :
Effect of UV treatment on the dielectric strength of BOPP capacitor film
Author :
Ho, Janet ; Boggs, Steven
Author_Institution :
Inst. of Mater. Sci., Connecticut Univ., Storrs, CT
fYear :
2006
fDate :
11-14 June 2006
Firstpage :
314
Lastpage :
317
Abstract :
The effect of UV treatment on dielectric breakdown strength of metallized biaxially-oriented polypropylene (BOPP) capacitor film was studied. Results from Weibull statistical analysis indicate that an optimal UV exposure level of ~3.4 J/cm2 (200-400 nm) increases the breakdown strength at 1% probability by ~20%. UV spectroscopic analysis indicates that the antioxidant in BOPP was consumed almost entirely. The results suggest that antioxidant remaining in the BOPP after processing may have an unfavorable effect on the breakdown strength of the film
Keywords :
Weibull distribution; capacitors; dielectric thin films; electric strength; polymer films; statistical analysis; ultraviolet radiation effects; ultraviolet spectra; BOPP; UV spectroscopic analysis; UV treatment effect; Weibull statistical analysis; antioxidant; biaxially-oriented polypropylene; capacitor film; dielectric breakdown strength; probability; Additives; Capacitors; Dielectric breakdown; Electric breakdown; Electric variables measurement; Electrodes; Lamps; Metallization; Optical films; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1089-084X
Print_ISBN :
1-4244-0333-2
Type :
conf
DOI :
10.1109/ELINSL.2006.1665320
Filename :
1665320
Link To Document :
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