DocumentCode
2353558
Title
Effect of UV treatment on the dielectric strength of BOPP capacitor film
Author
Ho, Janet ; Boggs, Steven
Author_Institution
Inst. of Mater. Sci., Connecticut Univ., Storrs, CT
fYear
2006
fDate
11-14 June 2006
Firstpage
314
Lastpage
317
Abstract
The effect of UV treatment on dielectric breakdown strength of metallized biaxially-oriented polypropylene (BOPP) capacitor film was studied. Results from Weibull statistical analysis indicate that an optimal UV exposure level of ~3.4 J/cm2 (200-400 nm) increases the breakdown strength at 1% probability by ~20%. UV spectroscopic analysis indicates that the antioxidant in BOPP was consumed almost entirely. The results suggest that antioxidant remaining in the BOPP after processing may have an unfavorable effect on the breakdown strength of the film
Keywords
Weibull distribution; capacitors; dielectric thin films; electric strength; polymer films; statistical analysis; ultraviolet radiation effects; ultraviolet spectra; BOPP; UV spectroscopic analysis; UV treatment effect; Weibull statistical analysis; antioxidant; biaxially-oriented polypropylene; capacitor film; dielectric breakdown strength; probability; Additives; Capacitors; Dielectric breakdown; Electric breakdown; Electric variables measurement; Electrodes; Lamps; Metallization; Optical films; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location
Toronto, Ont.
ISSN
1089-084X
Print_ISBN
1-4244-0333-2
Type
conf
DOI
10.1109/ELINSL.2006.1665320
Filename
1665320
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