• DocumentCode
    2353558
  • Title

    Effect of UV treatment on the dielectric strength of BOPP capacitor film

  • Author

    Ho, Janet ; Boggs, Steven

  • Author_Institution
    Inst. of Mater. Sci., Connecticut Univ., Storrs, CT
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    314
  • Lastpage
    317
  • Abstract
    The effect of UV treatment on dielectric breakdown strength of metallized biaxially-oriented polypropylene (BOPP) capacitor film was studied. Results from Weibull statistical analysis indicate that an optimal UV exposure level of ~3.4 J/cm2 (200-400 nm) increases the breakdown strength at 1% probability by ~20%. UV spectroscopic analysis indicates that the antioxidant in BOPP was consumed almost entirely. The results suggest that antioxidant remaining in the BOPP after processing may have an unfavorable effect on the breakdown strength of the film
  • Keywords
    Weibull distribution; capacitors; dielectric thin films; electric strength; polymer films; statistical analysis; ultraviolet radiation effects; ultraviolet spectra; BOPP; UV spectroscopic analysis; UV treatment effect; Weibull statistical analysis; antioxidant; biaxially-oriented polypropylene; capacitor film; dielectric breakdown strength; probability; Additives; Capacitors; Dielectric breakdown; Electric breakdown; Electric variables measurement; Electrodes; Lamps; Metallization; Optical films; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665320
  • Filename
    1665320