DocumentCode :
235360
Title :
Combine dynamic time-slice scaling with DVFS for coordinating thermal and fairness on CPU
Author :
Gangyong Jia ; Guangjie Han
Author_Institution :
Dept. of Comput. Sci. & Technol., Hangzhou Dianzi Univ., Hangzhou, China
fYear :
2014
fDate :
20-22 Oct. 2014
Firstpage :
50
Lastpage :
55
Abstract :
As power density increases with high technology, the high temperature has threatened the system performance, reliability and even system safety. Develop a thermal management for reducing temperature, but without disturbing fairness, is becoming more and more important. Therefore, in this paper, we propose a DTS-DVFS management which combines Dynamic Time-Slice Scaling (DTS) with Dynamic Voltage and Frequency Scaling (DVFS). Through fine-grained thermal characterization based on task behavior, dynamically determine both Time-slice Scaling factor (TSF) and Voltage and Frequency Scaling factor (VSF) for each task on real-time which not only reduces temperature but also retains fairness. Besides scaling both time-slice and voltage and frequency for each task according to TSF and VSF respectively, combining alternative scheduling scheme based on boosting thermal model which predicts the temperature of the chip. Through our experiments in real machine, results demonstrate our proposed policy can reduce the chip average and peak temperature maximums by 4.2°C and 2.9°C with negligible fairness loss.
Keywords :
power aware computing; processor scheduling; thermal management (packaging); CPU; DTS-DVFS management; TSF; VSF; boosting thermal model; chip average temperature maximum reduction; chip peak temperature maximum reduction; chip temperature prediction; dynamic time-slice scaling; dynamic voltage-and-frequency scaling; fine-grained thermal characterization; power density; real-time task; scheduling scheme; system performance; system reliability; system safety; task behavior; thermal management; thermal-fairness coordination; time-slice scaling factor; voltage-and-frequency scaling factor; Benchmark testing; Degradation; Equations; Linux; Temperature; Thermal management; Time-frequency analysis; DVFS; dynamic time-slice scaling; fairness; task behavior; thermal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computing, Communications and IT Applications Conference (ComComAp), 2014 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-4813-0
Type :
conf
DOI :
10.1109/ComComAp.2014.7017169
Filename :
7017169
Link To Document :
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