• DocumentCode
    2353608
  • Title

    A vertical MOSFET with a leveling, surrounding gate fabricated on a nanoscale island

  • Author

    Zheng, X. ; Pak, M. ; Huang, P.J. ; Choi, S. ; Wang, K.L.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • fYear
    1998
  • fDate
    22-24 June 1998
  • Firstpage
    70
  • Lastpage
    71
  • Abstract
    Several kinds of vertical MOSFET with an upward channel have been proposed and demonstrated by different authors. However, the benefit gained in terms of chip area saving is limited because micron size islands are used for the channels in all of these situations. In this paper, we present a novel vertical MOSFET with several new structural features. These features can lead to significant chip area saving (typically a reduction to one quarter) and performance improvement (due to better gate control and convenient channel engineering). They include: (1) a vertical island with nanoscale thickness; (2) superimposed source and drain; (3) a leveling and surrounding gate; (4) a withdrawn S-B junction, which can lead to a near zero junction depth; and (5) a natural connection from the channel to the substrate, which can used advantageously for the realization of a dynamic threshold and for the elimination of floating-body effects.
  • Keywords
    MOSFET; island structure; nanotechnology; semiconductor device testing; MOSFET upward channel; channel engineering; chip area; dynamic threshold; floating-body effect elimination; gate control; island channels; leveling gate structure; leveling/surrounding gate; nanoscale island fabrication; nanoscale island thickness; natural channel-substrate connection; near zero junction depth; performance improvement; structural features; superimposed source/drain; surrounding gate structure; vertical MOSFET; vertical island; withdrawn S-B junction; MOSFET circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1998. 56th Annual
  • Conference_Location
    Charlottesville, VA, USA
  • Print_ISBN
    0-7803-4995-4
  • Type

    conf

  • DOI
    10.1109/DRC.1998.731125
  • Filename
    731125