DocumentCode :
2353625
Title :
Efficiency of film capacitors in forced electrothermal modes
Author :
Emelyanov, Oleg A.
Author_Institution :
St. Petersburg State Polytech. Univ.
fYear :
2006
fDate :
11-14 June 2006
Firstpage :
326
Lastpage :
327
Abstract :
The efficiency of film capacitors in forced electrothermal modes is investigated. The lifetime in the range of 50-350 seconds is caused by the electrothermal breakdown. The reactive power values of 500-650 MVA/m3 are achieved. The lifetime prediction model´s data is compared to the results of the experiment. The criterion for the optimum choice of a capacitor in the investigated modes is offered
Keywords :
electron device testing; power capacitors; reactive power; film capacitor testing; forced electrothermal breakdown; lifetime prediction model; reactive power; Capacitance; Capacitors; Electric breakdown; Electrothermal effects; Heat transfer; Metallization; Predictive models; Temperature dependence; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1089-084X
Print_ISBN :
1-4244-0333-2
Type :
conf
DOI :
10.1109/ELINSL.2006.1665323
Filename :
1665323
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2353625
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