Title :
High-speed electro-absorption modulator based on sige HBT
Author :
Huang, Z. Rena ; Deng, Shengling ; Wu, Pengfei
Author_Institution :
Electr., Comput., & Syst. Eng. Dept., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
In this paper, we propose a silicon electro-absorption modulator (EAM) that is based on the NPN SiGe Heterojunction Bipolar Transistor (HBT). The SiGe HBT EAM is a carrier-injection type device in which electrons are injected from the emitter to the base and the collector region. Compared to other silicon-based injection-type modulators, the HBT optical modulator has the advantages of small footprint, high switching speed, and low driving voltage. Unlike phase modulator, the HBT EAM directly modulates light intensity; therefore, it does not require Mach-Zehnder Interferometer (MZI) or resonant cavity structures to convert phase information into the intensity for incoherent detection. As a result, the EAM design is simpler than the Electro-Optic (EO) modulator and consumes less surface area on a chip.
Keywords :
Ge-Si alloys; electro-optical modulation; heterojunction bipolar transistors; semiconductor materials; EAM design; HBT; HBT optical modulator; Mach-Zehnder interferometer; SiGe; carrier-injection type device; high-speed electro-absorption modulator; light intensity; npn heterojunction bipolar transistor; phase modulator; resonant cavity structures; silicon electro-absorption modulator; silicon-based injection-type modulators; Biomedical optical imaging; Heterojunction bipolar transistors; Modulation; Optical refraction; Optical variables control; Optical waveguides; Stimulated emission;
Conference_Titel :
Avionics, Fiber- Optics and Photonics Technology Conference (AVFOP), 2011 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-7344-1
DOI :
10.1109/AVFOP.2011.6082111