DocumentCode :
2353652
Title :
Thermal sensitivity analysis for the 119 PBGA-a framework for rapid prototyping
Author :
Mulgaonker, Shailesh ; Berg, Howard M.
Author_Institution :
Adv. Packaging Dev. Center, Motorola Inc., Tempe, AZ, USA
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
28
Lastpage :
37
Abstract :
New package prototyping is often a sequential process where the chip and system parameters are specified first, then the package design is initiated. A reduction in overall cycle time can be affected if the events occur simultaneously. This study proposes a methodology for addressing this issue. The method is outlined in the context of prototyping the 119 plastic ball grid array (PBGA) package thermal performance. The parameters influencing performance are system, device or package based. Ranges for the “yet-to-be-fixed” parameters are determined and factorial analyses used to yield approximate linear models with interactions for package performance. Once the device and system parameters are “fixed”, the linear equations are solved simultaneously with junction and board temperature constraints to yield a design options map for package layout
Keywords :
integrated circuit packaging; plastic packaging; sensitivity analysis; thermal analysis; 119 PBGA; approximate linear models; board temperature constraints; design options map; factorial analyses; junction temperature constraints; linear equations; overall cycle time; package layout; package performance; plastic ball grid array; rapid prototyping; thermal performance; thermal sensitivity analysis; Costs; Electronics packaging; Lead; Plastic packaging; Prototypes; Semiconductor device packaging; Sensitivity analysis; Substrates; Temperature; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.514357
Filename :
514357
Link To Document :
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