DocumentCode
235368
Title
Plasma-based die singulation processing technology
Author
Mackenzie, Kenneth D. ; Pays-Volard, David ; Martinez, Luis ; Johnson, Chris ; Lazerand, Thierry ; Westerman, Russell
Author_Institution
Plasma-Therm LLC, St. Petersburg, FL, USA
fYear
2014
fDate
27-30 May 2014
Firstpage
1577
Lastpage
1583
Abstract
In support of improved productivity for the semiconductor and optoelectronics manufacturing industry, new work is presented on the development of a plasma-based die singulation process technique for thin Si wafers. It is shown that the technique leads to a significant gain in productivity through reduced process times and increased available good die per wafer. Some additional related key benefits are increased yield, die strength, and the potential of nonorthogonal die.
Keywords
elemental semiconductors; microassembling; optoelectronic devices; semiconductor device manufacture; semiconductor industry; silicon; wafer level packaging; nonorthogonal die; optoelectronics manufacturing industry; plasma-based die singulation processing technology; semiconductor manufacturing industry; thin Si wafers; Laser beams; Plasmas; Productivity; Semiconductor lasers; Silicon; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897504
Filename
6897504
Link To Document