• DocumentCode
    235368
  • Title

    Plasma-based die singulation processing technology

  • Author

    Mackenzie, Kenneth D. ; Pays-Volard, David ; Martinez, Luis ; Johnson, Chris ; Lazerand, Thierry ; Westerman, Russell

  • Author_Institution
    Plasma-Therm LLC, St. Petersburg, FL, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    1577
  • Lastpage
    1583
  • Abstract
    In support of improved productivity for the semiconductor and optoelectronics manufacturing industry, new work is presented on the development of a plasma-based die singulation process technique for thin Si wafers. It is shown that the technique leads to a significant gain in productivity through reduced process times and increased available good die per wafer. Some additional related key benefits are increased yield, die strength, and the potential of nonorthogonal die.
  • Keywords
    elemental semiconductors; microassembling; optoelectronic devices; semiconductor device manufacture; semiconductor industry; silicon; wafer level packaging; nonorthogonal die; optoelectronics manufacturing industry; plasma-based die singulation processing technology; semiconductor manufacturing industry; thin Si wafers; Laser beams; Plasmas; Productivity; Semiconductor lasers; Silicon; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897504
  • Filename
    6897504