• DocumentCode
    2353774
  • Title

    Noise characterization and sensitivity analysis of IC packages

  • Author

    Chou, Tai-Yu ; Chakrabarti, P. ; Pratapneni, S.

  • Author_Institution
    Adv. Package Dev., LSI Logic Corp., Fremont, CA, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    64
  • Lastpage
    69
  • Abstract
    Techniques of determining the performance of IC packages and sensitivity analysis of noise to package physical parameters in electronic systems are presented. Results are shown for noise characterization of various drivers on the packages and sensitivity of noise parameters to package design parameters. Using the techniques of noise characterization, package and I/O driver performance limits in the system can be evaluated. Using the techniques of sensitivity analysis, performance improvement of any changes in the package design can be predicted and the package can be optimized during the design phase to satisfy electrical requirements of the system
  • Keywords
    integrated circuit noise; integrated circuit packaging; sensitivity analysis; I/O drivers; IC packages; electronic systems; noise parameters; sensitivity analysis; Active noise reduction; Degradation; Electronics packaging; Integrated circuit noise; Integrated circuit packaging; Noise figure; Noise measurement; Pulse measurements; Sensitivity analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.514363
  • Filename
    514363