DocumentCode
2353774
Title
Noise characterization and sensitivity analysis of IC packages
Author
Chou, Tai-Yu ; Chakrabarti, P. ; Pratapneni, S.
Author_Institution
Adv. Package Dev., LSI Logic Corp., Fremont, CA, USA
fYear
1995
fDate
21-24 May 1995
Firstpage
64
Lastpage
69
Abstract
Techniques of determining the performance of IC packages and sensitivity analysis of noise to package physical parameters in electronic systems are presented. Results are shown for noise characterization of various drivers on the packages and sensitivity of noise parameters to package design parameters. Using the techniques of noise characterization, package and I/O driver performance limits in the system can be evaluated. Using the techniques of sensitivity analysis, performance improvement of any changes in the package design can be predicted and the package can be optimized during the design phase to satisfy electrical requirements of the system
Keywords
integrated circuit noise; integrated circuit packaging; sensitivity analysis; I/O drivers; IC packages; electronic systems; noise parameters; sensitivity analysis; Active noise reduction; Degradation; Electronics packaging; Integrated circuit noise; Integrated circuit packaging; Noise figure; Noise measurement; Pulse measurements; Sensitivity analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.514363
Filename
514363
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