• DocumentCode
    2353779
  • Title

    Session 11B: Test Generation for New Fault Models and Circuits

  • fYear
    2004
  • fDate
    7-11 Nov. 2004
  • Firstpage
    892
  • Lastpage
    892
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-8702-3
  • Type

    conf

  • DOI
    10.1109/ICCAD.2004.1382700
  • Filename
    1382700
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2353779